Backside SEU laser testing for commercial off-the-shelf...

IEEE Transactions on Nuclear Science 2002 / 12 Vol. 49; Iss. 6

Backside SEU laser testing for commercial off-the-shelf SRAMs

Darracq, F., Lapuyade, H., Buard, N., Mounsi, F., Foucher, B., Fouillat, P., Calvet, M-C., Dufayel, R.
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Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.805393
Date:
December, 2002
File:
PDF, 758 KB
english, 2002
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