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Transient current spectroscopy of deep levels in...

Transient current spectroscopy of deep levels in semi-insulating polycrystalline silicon

Lombardo, S., Campisano, S. U.
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Volume:
66
Year:
1995
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.113878
File:
PDF, 342 KB
english, 1995
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