Coexistence of memory resistance and memory capacitance in...

Nanoscale Research Letters 2014 Vol. 9; Iss. 1

Coexistence of memory resistance and memory capacitance in TiO2 solid-state devices

Salaoru, Iulia, Li, Qingjiang, Khiat, Ali, Prodromakis, Themistoklis
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Volume:
9
Year:
2014
Language:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/1556-276X-9-552
File:
PDF, 847 KB
english, 2014
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