An X-Ray Study of Thermally Induced Stresses in...

An X-Ray Study of Thermally Induced Stresses in Microconstituents of Aluminum-Silicon Alloys

Nielsen, John P., Hibbard, Walter R.
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Volume:
21
Year:
1950
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1699773
File:
PDF, 389 KB
english, 1950
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