Mechanism of catastrophic degradation in InGaAsP/InP...

Journal of Applied Physics 1983 Vol. 54; Iss. 11

Mechanism of catastrophic degradation in InGaAsP/InP double-heterostructure light emitting diodes with Ti/Pt/Au electrodes

Ueda, Osamu, Yamakoshi, Shigenobu, Umebu, Itsuo, Sanada, Tatsuyuki, Kotani, Tsuyoshi
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Volume:
54
Year:
1983
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.331861
File:
PDF, 788 KB
english, 1983
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