Interfacial roughness of sputtered multilayers: Nb/Si
Fullerton, Eric E., Pearson, J., Sowers, C. H., Bader, S. D., Wu, X. Z., Sinha, S. K.Volume:
48
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.48.17432
Date:
December, 1993
File:
PDF, 1.53 MB
english, 1993