[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Failure mechanisms of gallium nitride leds related with passivation
Meneghini, M., Trevisanello, L.-R., Levada, S., Meneghesso, G., Tamiazzo, G., Zanoni, E., Zahner, T., Zehnder, U., Harle, V., Strauss, U.Year:
2005
Language:
english
DOI:
10.1109/iedm.2005.1609534
File:
PDF, 285 KB
english, 2005