Depth profiling of marker layers using x-ray waveguide...

Physical Review B 2005 / 8 Vol. 72; Iss. 7

Depth profiling of marker layers using x-ray waveguide structures

Gupta, Ajay, Rajput, Parasmani, Saraiya, Amit, Reddy, V. R., Gupta, Mukul, Bernstorff, Sigrid, Amenitsch, H.
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Volume:
72
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.72.075436
Date:
August, 2005
File:
PDF, 334 KB
english, 2005
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