Design and Experimental Characterization of a New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment
Malandruccolo, V, Ciappa, M, Rothleitner, H, Fichtner, WVolume:
11
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2011.2135354
Date:
June, 2011
File:
PDF, 1.05 MB
english, 2011