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[IEEE 2013 81st ARFTG Microwave Measurement Conference (ARFTG) - Seattle, WA, USA (2013.06.7-2013.06.7)] 81st ARFTG Microwave Measurement Conference - Removal of measurement artifacts present in high-power RF transistor loadpull test-fixtures
Barbieri, Travis, Aaen, Peter H., Noori, BasimYear:
2013
Language:
english
DOI:
10.1109/arftg.2013.6579050
File:
PDF, 564 KB
english, 2013