![](/img/cover-not-exists.png)
[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - Study of Residual charing in dielectric less capacitive MEMS switches
Mardivirin, D., Bouyge, D., Crunteanu, A., Pothier, A., Blondy, P.Year:
2008
DOI:
10.1109/mwsym.2008.4633096
File:
PDF, 460 KB
2008