[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - A novel Uniform-Channel-Program Erase (UCPE) flash EEPROM using an isolated P-well structure
Li, C.-N.B., Farenc, D., Singh, R., Yater, J., Liu, S., Chia-Lin Chang,, Bagchi, S., Chen, K., Ingersoll, P., Kuo-Tung Chang,Year:
2000
Language:
english
DOI:
10.1109/iedm.2000.904433
File:
PDF, 368 KB
english, 2000