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[IEEE Comput. Soc IEEE International High-Level Design Validation and Test Workshop - Berkeley, CA, USA (8-10 Nov. 2000)] Proceedings IEEE International High-Level Design Validation and Test Workshop (Cat. No.PR00786) - An RT-level fault model with high gate level correlation
Corno, F., Cumani, G., Sonza Reorda, M., Squillero, G.Year:
2000
Language:
english
DOI:
10.1109/hldvt.2000.889551
File:
PDF, 762 KB
english, 2000