[IEEE 2013 IEEE International Conference on Electro/ Information Technology (EIT) - Rapid City, SD, USA (2013.05.9-2013.05.11)] IEEE International Conference on Electro-Information Technology , EIT 2013 - Investigation of the electrical properties of PLD-grown Bi2Te3 and Sb2Te2
Shaik, Muneer, Motaleb, Ibrahim AbdelYear:
2013
Language:
english
DOI:
10.1109/eit.2013.6632707
File:
PDF, 761 KB
english, 2013