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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - The impact of high Vth drifts tail and real workloads on SRAM reliability

Angot, D., Huard, V., Quoirin, M., Federspiel, X., Haendler, S., Saliva, M., Bravaix, A.
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Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6861126
File:
PDF, 518 KB
english, 2014
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