Transmission electron microscope study of the crystal...

Transmission electron microscope study of the crystal structures and microstructures of ZrSi and HfSi in ultrahigh vacuum deposited metal thin films on (111)Si

Hseih, W. Y., Chen, L. J.
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Volume:
76
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.357141
File:
PDF, 1.08 MB
english, 1994
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