[IEEE 14th International Vacuum Microelectronics Conference - Davis, CA, USA (12-16 Aug. 2001)] IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) - The effect of deposition parameters on performance of VME-FPC
Yongji Lu,, Guangyi Liu,, Shanhong Xia,, Youjun Shao,, Huafen Shi,Year:
2001
Language:
english
DOI:
10.1109/ivmc.2001.939704
File:
PDF, 149 KB
english, 2001