[IEEE IEEE International Magnetics Conference - Kyongju, Korea (1999.05.18-1999.05.21)] IEEE International Magnetics Conference - Effect of ECR-ION milung on exchange busing in NiO/NiFe bilayers
Do-Guwn Hwang,, San-Suk Lee,, Geun-Young Ahn,, Chang-Man Park,, Jang-Roh Rhee,Year:
1999
Language:
english
DOI:
10.1109/intmag.1999.837520
File:
PDF, 89 KB
english, 1999