Optically detected magnetic resonance of dislocations in silicon
Kveder, V., Omling, P., Grimmeiss, H. G., Osipyan, Yu. A.Volume:
43
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.43.6569
Date:
March, 1991
File:
PDF, 153 KB
english, 1991