Error-resistant single-qubit gates with trapped ions

Physical Review A 2008 / 5 Vol. 77; Iss. 5

Error-resistant single-qubit gates with trapped ions

Timoney, N., Elman, V., Glaser, S., Weiss, C., Johanning, M., Neuhauser, W., Wunderlich, Chr.
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Volume:
77
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.77.052334
Date:
May, 2008
File:
PDF, 274 KB
english, 2008
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