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[ACM Press the 2014 ACM/SIGDA international symposium - Monterey, California, USA (2014.02.26-2014.02.28)] Proceedings of the 2014 ACM/SIGDA international symposium on Field-programmable gate arrays - FPGA '14 - Memory block based scan-BIST architecture for application-dependent FPGA testing
Ito, Keita, Yoneda, Tomokazu, Yamato, Yuta, Hatayama, Kazumi, Inoue, MichikoYear:
2014
Language:
english
DOI:
10.1145/2554688.2554764
File:
PDF, 426 KB
english, 2014