Direct measurement of backgrounds using reactor-off data in Double Chooz
Abe, Y., Aberle, C., dos Anjos, J. C., Barriere, J. C., Bergevin, M., Bernstein, A., Bezerra, T. J. C., Bezrukhov, L., Blucher, E., Bowden, N. S., Buck, C., Busenitz, J., Cabrera, A., Caden, E., CamilVolume:
87
Language:
english
Journal:
Physical Review D
DOI:
10.1103/PhysRevD.87.011102
Date:
January, 2013
File:
PDF, 848 KB
english, 2013