[IEEE 2010 Design, Automation & Test in Europe...

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[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Proactive NBTI mitigation for busy functional units in out-of-order microprocessors

Lin Li,, Youtao Zhang,, Jun Yang,, Jianhua Zhao,
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Year:
2010
Language:
english
DOI:
10.1109/date.2010.5457170
File:
PDF, 189 KB
english, 2010
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