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Compression test system for a single submicrometer particle
Yoshida, Mikiko, Ogiso, Hisato, Nakano, Shizuka, Akedo, JunVolume:
76
Year:
2005
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2038187
File:
PDF, 571 KB
english, 2005