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Development of “fragility” in relaxor ferroelectrics
Wang, Yi-zhen, Chen, Lan, Wang, Hai-yan, Frank Zhang, X., Fu, Jun, Xiong, Xiao-min, Zhang, Jin-xiuVolume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4864256
Date:
February, 2014
File:
PDF, 938 KB
english, 2014