Erratum: Copper ion transport induced dielectric failure:...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2009 Vol. 27; Iss. 1

Erratum: Copper ion transport induced dielectric failure: Inclusion of elastic drift and consequences for reliability [J. Vac. Sci. Technol. A 26, 1497 (2008)]

Achanta, Ravi S., Plawsky, Joel L., Gill, William N.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
27
Year:
2009
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.3054138
File:
PDF, 261 KB
english, 2009
Conversion to is in progress
Conversion to is failed