Electron spin resonance study of defects in Si[sub...

Journal of Applied Physics 2001 Vol. 89; Iss. 9

Electron spin resonance study of defects in Si[sub 1−x]Ge[sub x] alloy nanocrystals embedded in SiO[sub 2] matrices: Mechanism of luminescence quenching

Toshikiyo, Kimiaki, Tokunaga, Masakazu, Takeoka, Shinji, Fujii, Minoru, Hayashi, Shinji
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Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1362410
File:
PDF, 552 KB
english, 2001
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