The effect of thermal annealing on the properties of...

The effect of thermal annealing on the properties of Al–AlO[sub x]–Al single electron tunneling transistors

Scherer, H., Weimann, Th., Zorin, A. B., Niemeyer, J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1389077
File:
PDF, 370 KB
english, 2001
Conversion to is in progress
Conversion to is failed