[IEEE 2008 IEEE Instrumentation and Measurement Technology Conference - I2MTC 2008 - Victoria, BC, Canada (2008.05.12-2008.05.15)] 2008 IEEE Instrumentation and Measurement Technology Conference - A De-Embedding Technique for On-Wafer Simultaneous Impedance and Power Flow Measurements
El-Deeb, Walid S., Bensmida, Souheil, Ghannouchi, Fadhel M.Year:
2008
Language:
english
DOI:
10.1109/imtc.2008.4547004
File:
PDF, 1.15 MB
english, 2008