Design and testing of rapid single flux quantum shift...

Design and testing of rapid single flux quantum shift registers with magnetically coupled readout gates

Yuh, P., Mukhanov, O.A.
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Volume:
2
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.182733
Date:
January, 1992
File:
PDF, 884 KB
1992
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