A study of temperature-related non-linearity at the...

Journal of Applied Physics 2012 Vol. 112; Iss. 11

A study of temperature-related non-linearity at the metal-silicon interface

Gammon, P. M., Donchev, E., Pérez-Tomás, A., Shah, V. A., Pang, J. S., Petrov, P. K., Jennings, M. R., Fisher, C. A., Mawby, P. A., Leadley, D. R., McN. Alford, N.
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Volume:
112
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4768718
File:
PDF, 3.66 MB
english, 2012
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