Cross-sectional lateral-force microscopy of semiconductor...

Cross-sectional lateral-force microscopy of semiconductor heterostructures and multiple quantum wells

Bratina, G., Vanzetti, L., Franciosi, A.
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Volume:
52
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.52.R8625
Date:
September, 1995
File:
PDF, 868 KB
english, 1995
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