[IEEE 2006 International SiGe Technology and Device Meeting...

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[IEEE 2006 International SiGe Technology and Device Meeting - Princeton, NJ, USA ()] 2006 International SiGe Technology and Device Meeting - Direct Measurement of HH2-HH1 Intersubband Lifetimes in SiGe Quantum Cascade Structures

Rauter, P., Fromherz, T., Bauer, G., Vinh, N.Q., Phillips, P.J., Pidgeon, C.R., Murdin, B.N., Diehl, L., Dehlinger, G., Grutzmacher, D.
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Year:
2006
Language:
english
DOI:
10.1109/istdm.2006.246536
File:
PDF, 1.84 MB
english, 2006
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