The effect of the angle of incidence on proton induced single events in devices-a critical assessment by modeling
Akkerman, A., Barak, J., Levinson, J., Lifshitz, Y.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685249
Date:
June, 1998
File:
PDF, 729 KB
english, 1998