Low dose hard x-ray contact microscopy assisted by a...

AIP Advances 2013 Vol. 3; Iss. 4

Low dose hard x-ray contact microscopy assisted by a photoelectric conversion layer

Gomella, Andrew, Martin, Eric W., Lynch, Susanna K., Morgan, Nicole Y., Wen, Han
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Volume:
3
Year:
2013
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4802886
File:
PDF, 1.41 MB
english, 2013
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