[IEEE 2008 American Control Conference (ACC '08) - Seattle, WA (2008.06.11-2008.06.13)] 2008 American Control Conference - Model checking in-the-loop: Finding counterexamples by systematic simulation
Lerda, Flavio, Kapinski, James, Maka, Hitashyam, Clarke, Edmund M., Krogh, Bruce H.Year:
2008
Language:
english
DOI:
10.1109/acc.2008.4586906
File:
PDF, 365 KB
english, 2008