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[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Angled flip-flop single-event cross sections for submicron bulk CMOS technologies
Gaspard, N., Jagannathan, S., Diggins, Z., Reece, T., Wen, S-J., Wong, R., Lilja, K., Bounasser, M., Loveless, T. D., Holman, W. T., Bhuva, B. L., Massengill, L. W.Year:
2013
Language:
english
DOI:
10.1109/radecs.2013.6937376
File:
PDF, 1.40 MB
english, 2013