Lifetime determination for high-lying excited states using...

Applied Physics Letters 1995 Vol. 67; Iss. 16

Lifetime determination for high-lying excited states using Z scan

Wei, Tai-Huei, Huang, Tzer-Hsiang, Lin, Huang-Der, Lin, Sheng-Hsien
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Volume:
67
Year:
1995
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.115121
File:
PDF, 376 KB
english, 1995
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