Electromigration of vacancies in copper
Hoekstra, J., Sutton, A. P., Todorov, T. N., Horsfield, A. P.Volume:
62
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.62.8568
Date:
October, 2000
File:
PDF, 47 KB
english, 2000