[IEEE International Symposium on Advanced Packaging...

  • Main
  • [IEEE International Symposium on...

[IEEE International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces - Braselton, GA, USA (11-14 March 2001)] Proceedings International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces (IEEE Cat. No.01TH8562) - New dicing and thinning concept improves mechanical reliability of ultra thin silicon

Landesberger, C., Klink, G., Schwinn, G., Aschenbrenner, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2001
Language:
english
DOI:
10.1109/isaom.2001.916555
File:
PDF, 835 KB
english, 2001
Conversion to is in progress
Conversion to is failed