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[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - Analog Circuits Fault Diagnosis Based on Support Vector Machine

Yongkui, Sun, Guangju, Chen, Li Hui,
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Year:
2007
Language:
english
DOI:
10.1109/icemi.2007.4350996
File:
PDF, 520 KB
english, 2007
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