Atomic force microscope with integrated optical microscope for biological applications
Putman, Constant A. J., van der Werf, Kees O., de Grooth, Bart G., van Hulst, Niek F., Segerink, Frans B., Greve, JanVolume:
63
Year:
1992
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1143303
File:
PDF, 944 KB
english, 1992