Electrical and Structural Analysis of Crystal Defects After...

IEEE Journal of Photovoltaics 2015 / 1 Vol. 5; Iss. 1

Electrical and Structural Analysis of Crystal Defects After High-Temperature Rapid Thermal Annealing of Highly Boron Ion-Implanted Emitters

Krugener, Jan, Peibst, Robby, Alexander Wolf, F., Bugiel, Eberhard, Ohrdes, Tobias, Kiefer, Fabian, Schollhorn, Claus, Grohe, Andreas, Brendel, Rolf, Osten, H. Jorg
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Volume:
5
Language:
english
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/JPHOTOV.2014.2365468
Date:
January, 2015
File:
PDF, 799 KB
english, 2015
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