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Retraction: Grain size and strain effects on the optical and electrical properties of hafnium oxide nanocrystalline thin films [J. Appl. Phys. 108, 083529 (2010)]
Zoletnik, S., Kocsis, G., Bürger, G., Ignácz, P. N., Kardon, B., Ḱlvin, S., Bakos, J. S.Volume:
109
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3583532
File:
PDF, 249 KB
english, 2011