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[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Impulsive noise measurement methodologies for APD determination in M2M environments
Chilo, Jose, Karlsson, Carl, Angskog, Per, Stenumgaard, PeterYear:
2009
Language:
english
DOI:
10.1109/isemc.2009.5284577
File:
PDF, 361 KB
english, 2009