Scanned potential microscopy of edge and bulk currents in...

Physical Review B 1999 / 2 Vol. 59; Iss. 7

Scanned potential microscopy of edge and bulk currents in the quantum Hall regime

McCormick, Kent L., Woodside, Michael T., Huang, Mike, Wu, Mingshaw, McEuen, Paul L., Duruoz, Cem, Harris, J. S.
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Volume:
59
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.59.4654
Date:
February, 1999
File:
PDF, 216 KB
english, 1999
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