Development of Testing Device for Critical Current...

IEEE Transactions on Appiled Superconductivity 2009 / 06 Vol. 19; Iss. 3

Development of Testing Device for Critical Current Measurements for HTS/LTS

Qiuliang Wang,, Yinming Dai,, Baozhi Zhao,, Shousen Song,, Zhiqiang Cao,, Shunzhong Chen,, Quan Zhang,, Housheng Wang,, Junsheng Cheng,, Yuanzhong Lei,, Bai Ye,, Xian Li,, Jianhua Liu,, S
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Volume:
19
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2009.2018415
Date:
June, 2009
File:
PDF, 496 KB
english, 2009
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