Relationship between carrier diffusion lengths and defect...

Relationship between carrier diffusion lengths and defect density in hydrogenated amorphous silicon

Sakata, I., Yamanaka, M., Sekigawa, T.
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Volume:
81
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.363888
File:
PDF, 394 KB
english, 1997
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