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[IEEE 2013 25th International Conference on Microelectronics (ICM) - Beirut, Lebanon (2013.12.15-2013.12.18)] 2013 25th International Conference on Microelectronics (ICM) - Investigating the NBTI effect on P- and N-substrate MOS capacitors and p-MOSFET transistors
Benabdelmoumene, Abdelmadjid, Djezzar, Boualem, Tahi, Hakim, Chenouf, Amel, Mohamed, Goudjil, Kechouane, MohamedYear:
2013
Language:
english
DOI:
10.1109/icm.2013.6734981
File:
PDF, 557 KB
english, 2013