Role of boundary roughness in the electronic transport of Bi nanowires
Huber, T. E., Nikolaeva, A., Gitsu, D., Konopko, L., Graf, M. J.Volume:
104
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3041491
File:
PDF, 922 KB
english, 2008